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HK scientists find new way to spot fetal abnormalities

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Hong Kong researchers have produced a pioneering technology that allows pregnant women to find out in just one week if their unborn child has chromosome abnormalities that would result in severe disabilities.

The Fetal DNA Chip, developed at the Chinese University, adapts a technique used in screening tumours to track chromosome changes in the unborn child.

Known as comparative genomic hybridisation it can spot abnormalities that are invisible to the conventional approach, karyotype analysis, which uses microscopes.

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First used in 2009 at the prenatal genetic diagnosis centre of the university's department of obstetrics and gynaecology, it has since been used in 281 cases before being introduced to the public yesterday.

'We developed this chip because we wanted to introduce a more comprehensive search for genetic abnormalities with small DNA regions,' Professor Richard Choy Kwong-wai, an associate professor in the obstetrics department, said.

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The centre is the only place using the technology in a clinical setting.

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